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SPM Accessories → By AFM → Dimension

Dimension

Bruker’s large-sample Dimension AFMs deliver point defect resolution with open stage flexibility. Featuring high-resolution AFM performance normally associated with the best small-sample systems, these high-speed AFMs have been designed from top to bottom to deliver the lowest drift and noise. Researchers are now able to achieve high-resolution artifact-free images in minutes instead of hours. Utilizing exclusive PeakForce Tapping, Bruker’s Dimension AFMs go beyond topography to provide quantitative nanomechanical and nanoelectrical data of real-time changes.
DEV60-5F

76 mm evaporation covers

DFMA

Force Modulation cantilever holder for scanning in air with Dimension

PRSCL-10

Fluid Cantilver Holder Splash Guards for Closed-Loop Heads

PRSXYZ-10

Fluid Cantilver Holder Splash Guards for Dimension Hybrid XYZ

STR3-180P

Calibration artifact: 18nm step height, 3µm pitch

STR3-440P

Calibration artifact: 44nm step height, 3µm pitch

STS3-440P

Calibration artifact: 44nm step height, 3/10/20µm pitch, NIST traceable

STR3-1800P

Calibration artifact: 180nm step height, 3µm pitch

STR10-180P

Calibration artifact: 18nm step height, 10µm pitch

STS3-1800P

Calibration artifact: 180nm step height, 3/10/20µm pitch, NIST traceable

STS3-180P

Calibration artifact: 18nm step height, 3/10/20µm pitch, NIST traceable

VITA-TS-STHM

VITA Scanning Thermal Microscopy, SThM, test sample

ICON-PFQNM

NanoScope PeakForce QNM software option for the Dimension Icon 

EC-V2-CH BOOT

Boot for Second Generation Dimension EC Cell

EC-V2-SS ADAPTER

Small Sample Adapter for Second Generation Dimension EC Cell

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