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Dimension
Bruker’s large-sample Dimension AFMs deliver point defect resolution with open stage flexibility. Featuring high-resolution AFM performance normally associated with the best small-sample systems, these high-speed AFMs have been designed from top to bottom to deliver the lowest drift and noise. Researchers are now able to achieve high-resolution artifact-free images in minutes instead of hours. Utilizing exclusive PeakForce Tapping, Bruker’s Dimension AFMs go beyond topography to provide quantitative nanomechanical and nanoelectrical data of real-time changes.
Unmounted Oxide sample
Cross-Sectional Sample Holder
44.5 mm evaporation covers
Piezo Guards for Direct Drive Fluid Holders
SPM sample mounting disks, 6mm diameter
Calibration artifact: 100nm step height, 3µm pitch
Calibration artifact: 100nm step height, 3/10/20µm pitch, NIST traceable
Calibration artifact: 44nm step height, 10µm pitch
VITA nTA Calibration Sample Set
Piezo Guards for Direct Drive Fluid Holders
Piezo Guards for Direct Drive Fluid Holders
38 mm evaporation covers