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Dimension
Bruker’s large-sample Dimension AFMs deliver point defect resolution with open stage flexibility. Featuring high-resolution AFM performance normally associated with the best small-sample systems, these high-speed AFMs have been designed from top to bottom to deliver the lowest drift and noise. Researchers are now able to achieve high-resolution artifact-free images in minutes instead of hours. Utilizing exclusive PeakForce Tapping, Bruker’s Dimension AFMs go beyond topography to provide quantitative nanomechanical and nanoelectrical data of real-time changes.
Fluid Cantilever Holder Splash Guard for the Dimension ICON SPM
Peak Force QNM Sample Kit, Samples on 12mm discs
Cover Glass for Second Generation Dimension EC Cell
STM tip holder for Dimension 3000 & 5000 series SPMs
Unmounted n-type staircase SSRM sample.
Unmounted p-type staircase SSRM sample
Cantilever & wafer tool kit: 1 scribe, 1 wafer tweezers, 3 regular tweezers
76 mm silicone evaporation covers
SCM cantilever holder for Dimension series SPMs
Tip storage kit with gel for silicon cantilevers
Calibration Artifact: 100nm Depth, 1µm Pitch, Pt Coated
Fluid Cantilver Holder Splash Guards
Tip storage kit with gel for silicon nitride cantilevers
Unmounted Oxide sample
Dimension Direct Drive Tapping EC Cantilever Holder