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Dimension
Bruker’s large-sample Dimension AFMs deliver point defect resolution with open stage flexibility. Featuring high-resolution AFM performance normally associated with the best small-sample systems, these high-speed AFMs have been designed from top to bottom to deliver the lowest drift and noise. Researchers are now able to achieve high-resolution artifact-free images in minutes instead of hours. Utilizing exclusive PeakForce Tapping, Bruker’s Dimension AFMs go beyond topography to provide quantitative nanomechanical and nanoelectrical data of real-time changes.
High Efficiency Direct Drive TappingMode Cantilever Holder for Scanning in Fluid with Dimension Series SPMs; replaces DDFML-DD, DDFMLSP
Highly Ordered Pyrolytic Graphite, Grade ZYB
Fused Silica 72.9 GPa sample for PeakForce QNM.
Roughness Sample, 12mm Mounted
PDMS Gel Sample, Tack 4, 12mm Mounted
DTRCH-AM Cantilever Holder Spring Repair Kit
Calibration Artifact: 100nm Depth, 1µm Pitch, Pt Coated, on 15mm Puck
Gold Sample, on 15mm Puck
SPM cross-sectional sample holder
TRmode Cantilever Holder for TUNA, CAFM or SSRM
Titanium roughness sample
Calibration artifact: 180nm step height, 10µm pitch
MFM starter kit for Dimension series SPMs
Calibration Artifact: 180nm Depth, 10μm Pitch, Pt Coated, on 15mm Puck
Micro-vise sample holder for polymer & other soft materials