Calibration artifact: 44nm step height, 10µm pitch
SPM sample mounting disks, 6mm diameter
Calibration artifact: 100nm step height, 3/10/20µm pitch, NIST traceable
Calibration artifact: 180nm step height, 3µm pitch
Calibration artifact: 18nm step height, 10µm pitch
Calibration artifact: 180nm step height, 3/10/20µm pitch, NIST traceable
Calibration artifact: 18nm step height, 3/10/20µm pitch, NIST traceable
Calibration artifact: 18nm step height, 3µm pitch
Calibration artifact: 44nm step height, 3/10/20µm pitch, NIST traceable
Calibration artifact: 44nm step height, 3µm pitch
