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VGRP-UM

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VGRP-UM

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Product #: VGRP-UM
Calibration artifact, 180nm step height, 10µm pitch.

This Bruker SurfaceTopography Reference Dies have a variety of step heights and pitches fordaily monitoring of SPM performance. The silicon die with patternedlayer of SiO2 is coated with Pt.

All die are 8mm x 8mm and unmounted. They are not certified or traceable to NIST.

Replaces model STR10-1800P.
Price: $995.00 (USD) 
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