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STR3-180P

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STR3-180P

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Product #: STR3-180P
Calibration artifact: 18nm step height, 3µm pitch. This VLSI Surface Topography Reference Dies have a variety of Step heights and Pitchs for daily monitoring of SPM performance. The silicon die with patterned layer of SiO2 is coated with Pt. All die are 8mm x 8mm and unmounted. They are not certified or traceable to NIST.
Price: $1,700.00 (USD) 
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