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PFDT750

Product Description:

High aspect ratio probe for repeatable, accurate depth metrology and imaging on challenging structures such as deep trenches and pits, as encountered on semiconductor samples and optics.

Designed for PeakForce Tapping operation on Dimension Icon.

750nm tall spike with 10nm end radius and 65nm base width

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Model Instrument Mount Pack Size Price Pack Quantity
PFDT750 Dimension Icon Unmounted 5 $1,125.00 (USD)

Quantity discounts available

QtyPrice/Pack
2-6$1,070.00 (USD)
7+$1,015.00 (USD)



Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 130 100 160 0.4 0.2 0.6 60 55 65 30 27 33

Tip Specification

Geometry: Rotated (Symmetric)
Tip Height (h): 3-8µm
Front Angle (FA): 15+/-2º
Back Angle (BA): 25+/-2 º
Side Angle (SA): 17.5+/-2 º
Tip Radius (Nom): 10 nm
Tilt Compensation: 12º
SpikeW: 65 nm
Spike Length(um): 0.6-0.9 µm
Tip Coating: None

Cantilever Specification

Geometry: Special
Cantilevers Number: 1
Cantilever Thickness (Nom): 0.5 µm
Cantilever Thickness (RNG): 0.47-0.53 µm
Back Side Coating: Reflective Aluminum
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