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Product Description:

Nanomechanics Probe, 350 N/m, 750kHz, 10nm ROC, 5-Pack. Uncalibrated.
These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and can image the indents at high resolution in-situ using the same probe. Each cantilever comes individually characterized with both spring constant and tip radius accurately measured, to enable fully quantitative nanomechanical measurements. Each probe comes with a high-resolution SEM image showing the precise tip shape to enable fully quantitative measurements. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam. 

Nanomechanical modes: Tomography, nanoscratching, and nanoindentation, and their combination with PeakForce QNM, FASTForce Volume, or contact resonance.

All Adama probes are now included in the Sader Method - Global Calibration Initiative.

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Model Instrument Mount Pack Size Price Pack Quantity
NM-RC All Unmounted 5 $1,500.00 (USD)

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 750 500 1000 350 100 650 125 115 135 30 25 35

Tip Specification

Geometry: Standard
Tip Height (h): 12.5 +/- 2.5µm
Front Angle (FA): 25+/-5º
Back Angle (BA): 15+/-5 º
Side Angle (SA): 22.5+/-5 º
Tip Radius (Nom): 10 nm
Tip SetBack (TSB)(Nom): 15-25 µm
Tilt Compensation: 2 +/- 1º
Tip Coating: Highly conductive single cystal diamond

Cantilever Specification

Material: Diamond nmech probe, 150N/M, UNCALIBRATED, 5PK
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 4 µm
Cantilever Thickness (RNG): 3.5-4.5 µm
Back Side Coating: Reflective Au