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Product Description:

High aspect ratio probe for small scale structures. This model offers 100nm tall cylindrical shaped pillar tips with 20nm base diameter, combined with an intermediate 2.8N/m spring constant. As with all Adama probes, these are formed out of single crystal boron doped diamond and are wear resistant and conductive. Suitable for electrical characterization with PeakForce TUNA, TUNA, and CAFM.

All Adama probes are now included in the Sader Method - Global Calibration Initiative.

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Model Instrument Mount Pack Size Price Pack Quantity
AD-2.8-P20 All Unmounted 5 $2,500.00 (USD)

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 65 50 100 2.8 1 6 225 215 235 35 30 40

Tip Specification

L225um, W35um, K2.8N/m, F65kHz,R<20nm, 100nm tall
Geometry: Standard
Tip Height (h): 12.5 +/- 2.5 umµm
Front Angle (FA): 25+/-5degº
Back Angle (BA): 15+/-5deg º
Side Angle (SA): 22.5+/-5deg º
Tip Radius (Nom): 20nm nm
Tilt Compensation: 4 +/- 1degº
Spike Length(um): 15-25 um µm
Tip Coating: Highly conductive single cystal diamond

Cantilever Specification

Material: Diamond pillar, 20nm-w, med-k, 5pk
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 1.5um µm
Cantilever Thickness (RNG): 1-2um µm
Back Side Coating: Reflective Au