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FM-LC

Product Description:

High wear resistant diamond cone probe with high probe-to-probe consistency in tip shape and a tip-radius of 20nm. Ideally suited to long lifetime imaging on low relief samples at moderately high resolution. Conductive with a contact resistance in the 100kOhm range. Intermediate spring constant of 8N/m. For even higher resolution consider the AD series of diamond probes.

Applications include

  • Topography imaging in PeakForce Tapping, Tappingmode, and contact mode.
  • Electrical characterization with PeakForce TUNA, TUNA, CAFM.
  • Nanomechanics with PeakForce QNM, FASTForce Volume, contact resonance, nanoindentation.

Add To Cart

Model Instrument Mount Pack Size Price Pack Quantity
FM-LC All Unmounted 5 $500.00 (USD)


Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 100 50 150 8 4 16 225 215 235 28 23 33

Tip Specification

Highly wear resistant, single crystal boron-doped diamond probes. Conductive with a contact resistance in the 100kOhm range. 20nm end radius.
Geometry: Standard
Tip Height (h): 12.5 +/- 2.5µm
Front Angle (FA): 25+/-5º
Back Angle (BA): 15+/-5 º
Side Angle (SA): 22.5+/-5 º
Tip Radius (Nom): 20 nm
Tip SetBack (TSB)(Nom): 15-25 µm
Tilt Compensation: 0 +/- 1º
Tip Coating: Highly conductive single cystal diamond

Cantilever Specification

Material: Diamond cone probe, 8N/m
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3 µm
Cantilever Thickness (RNG): 2.5-3.5 µm
Back Side Coating: Reflective Au