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Product Description:

High aspect ratio probe for small scale structures. This model offers 100nm tall cylindrical shaped pillar tips with 40nm base diameter, combined with an intermediate 2.8N/m spring constant. As with all Adama probes, these are formed out of single crystal boron doped diamond and are wear resistant and conductive. Suitable for electrical characterization with PeakForce TUNA, TUNA, and CAFM.

All Adama probes are now included in the Sader Method - Global Calibration Initiative.

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Model Instrument Mount Pack Size Price Pack Quantity
AD-2.8-P40 All Unmounted 5 $1,250.00 (USD)

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 65 50 100 2.8 1 6 225 215 235 35 30 40

Tip Specification

Geometry: Standard
Tip Height (h): 12.5 +/- 2.5µm
Front Angle (FA): 25+/-5º
Back Angle (BA): 15+/-5 º
Side Angle (SA): 22.5+/-5 º
Tip Radius (Nom): 40 nm
Tip SetBack (TSB)(Nom): 15-25 µm
Tilt Compensation: 5 +/- 1º
SpikeH(Rng): 100 nm
Tip Coating: Highly conductive single cystal diamond

Cantilever Specification

Material: Diamond pillar, 40nm-w, med-k, 5pk
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 1.5 µm
Cantilever Thickness (RNG): 1-2 µm
Back Side Coating: Reflective Au