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Product Description:

Nanomechanics Probe, 350 N/m, 750kHz, 25nm ROC, 5-Pack. Uncalibrated.

These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and can image the indents at high resolution in-situ using the same probe. Each probe comes with a high-resolution SEM image showing the precise tip shape. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.

All Adama probes are now included in the Sader Method - Global Calibration Initiative.

Nanomechanical modes: Tomography, nanoscratching, and nanoindentation, and their combination with PeakForce QNM, FASTForce Volume, or contact resonance.

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Model Mount Pack Size Price Pack Quantity
NM-TC unmounted 5 $750.00 (USD)

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
750 500 1000 350 100 600 125 115 135 30 25 35

Tip Specification

Geometry: Cone
Tip Height (h): 12.5 +/- 2.5µm
Front Angle (FA): 25 +/- 5º
Back Angle (BA): 15 +/- 5 º
Side Angle (SA): 22.5 +/- 5 º
Tip Radius (Nom): 25 nm
Tip Radius (Max): 35 nm
Tilt Compensation: 0 +/- 1º

Cantilever Specification

Material: Diamond
Cantilever Thickness (Nom): 4 µm