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Product Description:

Value Line etched Silicon probes with conductive Platinum-Iridium (PtIr) coating on the tip for electrical characterization of samples.

 Product Sheet

- Conductive PtIr coated tip that is ideal for various electrical applications such as:
*Electrical Force Microscopy (EFM)
*Surface Potential Microscopy orKelvin Probe Force Microscopy (SPoM or KPFM)
*Tunneling AFM andConductive AFM (TUNA and CAFM)
*Scanning Capacitance Microscopy (SCM)
*Piezoforce Microscopy (PFM)
- 2.8 N/m, 75 kHz, 25 nm tip radius, PtIr reflex coating.
- 10 probes per pack.
- Compatible with most commercially available AFMs.

Add To Cart

Model Instrument Mount Pack Size Price Pack Quantity
FMV-PT All Unmounted 10 $235.00 (USD)

Quantity discounts available

2-4$223.25 (USD)
5-37$204.45 (USD)
38+$159.80 (USD)

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 75 50 100 2.8 1 5 230 225 235 33 28 38

Tip Specification

Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5 º
Side Angle (SA): 22.5 ± 2.5 º
Tip Radius (Nom): 25 nm
Tip SetBack (TSB)(Nom): 11.5 µm
Tip Set Back (TSB)(RNG): 8-15 µm
Tip Coating: Conductive Ptlr

Cantilever Specification

Material: 0.01 - 0.025 Ocm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.75 µm
Cantilever Thickness (RNG): 2.0 - 3.5 µm
Front Side Coating: Conductive PtIr
Back Side Coating: Reflective PtIr