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Product Description:

Nanomechanics Probe, 150 N/m, 500 kHz, 10 nm ROC, 5-Pack

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These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and can image the indents at high resolution in-situ using the same probe. Each cantilever comes individually characterized with both spring constant and tip radius accurately measured, to enable fully quantitative nanomechanical measurements. Each probe comes with a high-resolution SEM image showing the precise tip shape to enable fully quantitative measurements. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.

Nanomechanical modes: Topography, nanoscratching, and nanoindentation, and their combination with PeakForce QNM, FASTForce Volume, or contact resonance.

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 500 300 800 150 100 300 125 115 135 30 25 35

Tip Specification

Cone ½ angle = 45 ± 3°
Geometry: Cone
Tip Height (h): 12.5 ± 2.5µm
Tip Radius (Nom): 10 ± 5 nm
Tilt Compensation: 1º
SpikeH(Rng): 400 ± 100 nm
Tip Coating: Highly conductive single crystal diamond

Cantilever Specification

Back Side Coating: Reflective Au