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Product Description:

Super Sharp Conductive Single Crystal Diamond Probes, 0.5 N/m, 30 kHz, <5 nm ROC, 5-Pack

Currently out of stock. Choose AD-2.8-SS instead.

Super sharp tip for highest resolution combined with lowest spring constant, suitable for soft and fragile samples, with PeakForce Tapping or contact mode feedback, including:

- Topography imaging in PeakForce Tapping and contact mode.
- Electrical characterization with PeakForce TUNA, TUNA, CAFM.
- Nanomechanics with PeakForce QNM, FASTForce Volume.

Highly conductive Apex Sharp diamond probes, formed by a unique patentedprocess ensure the best possible nanomechanical and electricalperformance. These tips are sharper and last longer than any otherelectrical AFM probe. The conductive diamond coating is highly dopedwith boron which leads to a macroscopic resistivity of 0.003 - 0.005Ohm∙cm. Contact resistance is typically 10 kΩ depending on contactradius measured on a silver surface. By using wear-resistant sharpdiamond probes the contact size is well characterized and stays constantduring mechanical measurements. Quantitative and repeatablemeasurements for over 24 hours of continuous use have been demonstratedwith these probes. A gold reflex coating deposited on the detector sideof the cantilever to enhance the reflectance of the laser beam.
Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 30 10 50 0.5 0.1 1.0 225 215 235 48 43 53

Tip Specification

Geometry: Standard
Tip Height (h): 12.5 ± 2.5µm
Front Angle (FA): 25 ± 5º
Back Angle (BA): 15 ± 5 º
Side Angle (SA): 22.5 ± 5 º
Tip Radius (Nom): <5 nm
Tilt Compensation: 0 ± 1º
Tip Set Back (TSB)(RNG): 15 - 25 µm
SpikeH(Rng): 300 ± 100 nm
Tip Coating: Highly conductive single crystal diamond

Cantilever Specification

Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 1 µm
Cantilever Thickness (RNG): 0.5 - 1.5 µm
Back Side Coating: Reflective Au
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