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***Note: Bruker's new SCM-PIC-V2 probe replaces the legacy SCM-PIC probe.  Bruker recommends transitioning to this probe.  The legacy SCM-PIC is still available for ordering while supplies last, at which point in will become obsolete.

Built on the high-performance RESP-10 AFM probe, Bruker's SCM-PIC-V2 probe has a Platinum-Iridium coated,electrically conductive tip that is ideal for Electrical Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), and other electrical characterization applications.  The Pt-Ir coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apex of the tip.  The coating on the back side of the cantilever compensates for the stress created by the front side coating and also enhances laser reflectivity by a factor of up to 2.5 times.

AFM users with Bruker's latest electrical characterization techniques based upon PeakForce Tapping technology should consider using PFTUNA or PFQNE-AL probes.

The new design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics  

Add To Cart

Model Instrument Mount Pack Size Price Pack Quantity
SCM-PIC-V2 All Unmounted 10 $450.00 (USD)

Quantity discounts available

2-6$382.50 (USD)
7-15$337.50 (USD)
16-24$292.50 (USD)
25-37$247.50 (USD)
38+$225.00 (USD)

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 10 4 16 0.10 0.03 0.20 450 440 460 35 33 37

Tip Specification

This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.
Geometry: Rotated
Tip Height (h): 10 - 15µm
Front Angle (FA): 17.5 ± 2.5º
Back Angle (BA): 25 ± 2.5 º
Side Angle (SA): 20 ± 2.5 º
Tip Radius (Nom): 25 nm
Tip SetBack (TSB)(Nom): 9.5 µm
Tip Set Back (TSB)(RNG): 7 - 12 µm
Tip Coating: PtIr

Cantilever Specification

The Platinum-Iridium reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 1.8 µm
Cantilever Thickness (RNG): 1.05 - 2.55 µm
Front Side Coating: Conductive PtIr
Back Side Coating: Reflective PtIr
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