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SCM-PIT-V2

Product Description:

Bruker's new SCM-PIT-V2 probe replaces the legacy SCM-PIT probe. 

Built on the high-performance RFESP-75AFM probe, Bruker's SCM-PIT-V2 probe has a Platinum-Iridium coated,electrically conductive tip that is ideal for Electrical ForceMicroscopy (EFM), Kelvin Probe Force Microscopy (KPFM), ScanningCapacitance Microscopy (SCM), and other electrical characterizationapplications.  The Pt-Ir coating on the front side of the cantileverprovides a metallic electrical path from the cantilever die to the apexof the tip.  The coating on the back side of the cantilever compensatesfor the stress created by the front side coating and also enhances laserreflectivity by a factor of up to 2.5 times.

AFM users with Bruker's latest electrical characterization techniquesbased upon PeakForce Tapping technology should consider using PFTUNA or PFQNE-AL probes.

The new design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics

Add To Cart

Model Instrument Mount Pack Size Price Pack Quantity
SCM-PIT-V2 All Unmounted 10 $450.00 (USD)

Quantity discounts available

QtyPrice/Pack
2-6$382.50 (USD)
7-15$337.50 (USD)
16-24$292.50 (USD)
25-37$247.50 (USD)
38+$225.00 (USD)



Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 75 50 100 3.0 1.5 6.0 225 215 235 35 33 37

Tip Specification

This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.
Geometry: Rotated
Tip Height (h): 10 - 15µm
Front Angle (FA): 17.5 ± 2.5º
Back Angle (BA): 25 ± 2.5 º
Side Angle (SA): 20 ± 2.5 º
Tip Radius (Nom): 25 nm
Tip SetBack (TSB)(Nom): 9.5 µm
Tip Set Back (TSB)(RNG): 7 - 12 µm
Tip Coating: PtIr

Cantilever Specification

The Platinum-Iridium reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.80 µm
Cantilever Thickness (RNG): 2.05 - 3.55 µm
Front Side Coating: Conductive PtIr
Back Side Coating: Reflective PtIr
Optional Product Offerings
SCM-PIC-V2
***Note: Bruker's new SCM-PIC-V2 probe replaces th...
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PFQNE-AL
Bruker's new PeakForce KPFM probes, 10-pack. ...
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SCM-PTSI
Bruker SCM-PtSi Probes For the highest resoluti...
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