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Product Description:

This model has been obsoleted and replaced by the 10-pack of the equivalent probe, model HAR1-200A-10.

A pack of High Aspect Ratio Probes
Tilt-Compensated High Aspect Ratio (5:1) Focused Ion Beam (FIB) probes for high resolution TappingMode imaging on samples with tall/deep geometries.  Unmounted for all AFMs.
Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 320 230 410 42 10 80 125 110 140 40 30 50

Tip Specification

High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 5:1 at 1um from tip apex.
Geometry: High Aspect Ratio
Tip Height (h): 10 - 15µm
Front Angle (FA): 5 ± 0.5º
Back Angle (BA): 5 ± 0.5 º
Side Angle (SA): 5 ± 0.5 º
Tip Radius (Nom): 10 nm
Tip Radius (Max): 15 nm
Tip SetBack (TSB)(Nom): 15 µm
Tilt Compensation: 12º
Tip Set Back (TSB)(RNG): 5 - 25 µm
SpikeH(Rng): 1000 - 2000 nm
SpikeW: 200 nm

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 4 µm
Cantilever Thickness (RNG): 3.5 - 4.5 µm
Back Side Coating: Reflective Aluminum
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