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ESPW-V2

Product Description:

A wafer High quality etched silicon probes for contact mode imaging in air.  Unmounted for use on standard AFM's.

Bruker AFM Probes has introduced an improved version of its popular, ESP/ESPA AFM probes. Bruker’s new line of ESP high quality premium etched silicon probes set the industry standard for contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model ESPAW-V2.

The current model ESPW is available for ordering through early 2015 at which point, it will become obsolete.

Add To Cart

Model Instrument Mount Pack Size Price Pack Quantity
ESPW-V2 All Unmounted 375 $5,985.00 (USD)


Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 13 9 17 0.2 0.05 0.4 450 440 460 50 48 52

Tip Specification

Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5 º
Side Angle (SA): 22.5 ± 2.5 º
Tip Radius (Nom): 8 nm
Tip Radius (Max): 12 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2 µm
Cantilever Thickness (RNG): 1.25 - 2.75 µm
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