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DDESP-V2

Product Description:

Bruker DDESP-V2 Electrical Probes

***Note: Bruker's new DDESP-V2 probe replaces the legacy DDESP-10 probe.  Bruker recommends transitioning to this probe.  The legacy DDESP-10 is no longer available for ordering.

Providing consistent performance and high sensitivity.

Bruker's new conductive diamond coated probe provides high performance Scanning Spreading Resistance Microscopy (SSRM) and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices,  Microelectromechanical Systems (MEMS), and biosensors providing the prolonged tip lifetime in combination with boosted conductivity.

The DDESP-V2 probe provides:
  • • High electrical performance due to its consistent tip shape
    • Sensitive nanoelectrical measurements with highly conductive coating
    • High resolution electrical imaging with a sharp conductive tip
  • • High quality probe manufactured by Bruker AFM Probes

Other applications of the DDESP-V2 probe include: Scanning Capacitance Microscopy (SCM), conductivity measurements (C-AFM and PeakForce TUNA), and other electrical characterization applications.

For the highest resolution SSRM measurements, Bruker also offers solid diamond probes with pyramidal tips; please see model SSRM-DIA.

For non-electrical applications where wear resistance is required, the diamond-like carbon (DLC) coated probes, Model TESPD provide a cost effective alternative.

Bruker Atomic Force Microscopy group also provides many other nano-electrical probes and modes for AFM based electrical measurements including our unique PeakForce KPFM & PeakForce TUNA modes.

Add To Cart

Model Instrument Mount Pack Size Price Pack Quantity
DDESP-V2 All Unmounted 10 $1,300.00 (USD)

Quantity discounts available

QtyPrice/Pack
2-6$1,105.00 (USD)
7-15$975.00 (USD)
16-24$845.00 (USD)
25-37$715.00 (USD)
38+$585.00 (USD)



Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 450 300 600 80 30 180 125 115 135 40 38 42

Tip Specification

The doped diamond coating is used to harden the tip in applications that require both increased wear resistance and a conductive tip. The tradeoff for the increased lifetime is that the coating also increases the diameter of the tip. If a conductive coating is not needed, the DLC coated probes (Model# TESPD) provide a cost effective alternative.
Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 17.5 ± 2.5 º
Side Angle (SA): 20 ± 2.5 º
Tip Radius (Nom): 100 nm
Tip Radius (Max): 150 nm
Tip SetBack (TSB)(Nom): 14 µm
Tip Set Back (TSB)(RNG): 11 - 16 µm
Tip Coating: Conductive Diamond

Cantilever Specification

The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.
Material: 0.010-0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.6 µm
Cantilever Thickness (RNG): 2.85 - 4.35 µm
Front Side Coating: Conductive Diamond
Back Side Coating: Reflective Aluminum
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