Home → Product
Easy Product Wizard
Search Products Clear selection


Product Description:

Olympus OMCL-AC240TM-R3

OSCM-PT-R3 series probes have platinum-deposited cantilevers that aresuitable for conducting scanning probe microscopy in air usingelectric force microscopy (EFM) or Kelvin probe force microscopy (KFM) modes, with an unprecedented sharpness of 15nm radius as a metal coated probe.

These probes feature:

1) High electrical conductivity:
The platinum-deposited probe shows lower conductivity in one and a halforders of magnitude than that of highly doped silicon probes. Its probe resistanceof 350 ohms is sufficiently low for electric measurements required highelectro-potential resolution. The surfaces of precious metal coatingsare free from oxidization and are electrically stable.

2) High resolution:
The apex of 15 nm (typ.) radius is prominently sharp among metal-coated probes (see the tip apex). The thin and sharp tetrahedral probe reveals sample surface precisely both in electrically and in topographically.

3) Visible apex tip:
OSCM-PT-R3 has a tetrahedral tip on the exact end of thecantilever. Since the tip isn't hidden by the body of cantilever, it canbe positioned exactly at a point of interest using an opticalmicroscopy.

The current model OSCM-PT is available for ordering through early 2014 at which point, it will become obsolete.

Add To Cart

Model Instrument Mount Pack Size Price Pack Quantity
OSCM-PT-R3 All Unmounted 10 $550.00 (USD)

Quantity discounts available

2-6$467.50 (USD)
7-15$412.50 (USD)
16-24$357.50 (USD)
25+$302.50 (USD)

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 70 50 90 2 0.6 3.5 240 225 255 40 38 42

Tip Specification

Geometry: Visible Apex
Tip Height (h): 9 - 19µm
Front Angle (FA): 0 ± 1º
Back Angle (BA): 35 ±1 º
Side Angle (SA): 18 ±1 º
Tip Radius (Nom): 15 nm
Tip Radius (Max): 25 nm
Tip SetBack (TSB)(Nom): 0 µm

Cantilever Specification

Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.02 Ωcm Silicon
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.3 µm
Cantilever Thickness (RNG): 1.6 - 3.0 µm
Front Side Coating: Conductive Platinum
Back Side Coating: Reflective Aluminum
Top Layer Front: 20 nm of Pt
Top Layer Back: 100 nm of Al
Optional Product Offerings
Bruker SCM-PtSi Probes For the highest resoluti...
Details | Shop
A pack of Conductive Silicon Probes.  Bru...
Details | Shop
This probe is now obsolete. Bruker has launched an...
Details | Shop
***Note: Bruker has launched an improved SCM-PIT-V...
Details | Shop