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Product Description:

A pack of Conductive Silicon Probes. 

Bruker's Value Line Probe for Electrical Characterization with soft TappingMode or other "AC/non-contact modes."

- Tip radius of 25 nm nominal.
- Platinum-Iridium coated, electrically conductive tip that is ideal for various electrical characterization applications.
-The Pt-Ir coating on the front side of the cantilever provides ametallic electrical path from the cantilever die to the apex of the tip.
- The coating on the back side of the cantilever enhances laser reflectivity.
- Unmounted for all AFMs.

Add To Cart

Model Instrument Mount Pack Size Price Pack Quantity
FMV-PT All Unmounted 10 $235.00 (USD)

Quantity discounts available

2-4$223.25 (USD)
5-37$204.45 (USD)
38+$159.80 (USD)

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 75 50 100 2.8 1 5 230 225 235 33 28 38

Tip Specification

Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5ºº
Back Angle (BA): 15 ± 2.5º º
Side Angle (SA): 22.5 ± 2.5º º
Tip Radius (Nom): 25 nm
Tip SetBack (TSB)(Nom): 11.5 µm
Tip Set Back (TSB)(RNG): 8-15 µm

Cantilever Specification

Material: 0.01 - 0.025 Ocm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.75 µm
Cantilever Thickness (RNG): 2.0 - 3.5 µm
Front Side Coating: Conductive PtIr
Back Side Coating: Reflective PtIr
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