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Product Description:

A pack of Conductive Silicon Probes. 

Bruker's Value Line Probe for Electrical Characterization using Contact Mode in air.

- Tip radius of 25 nm nominal.
- Platinum-Iridium coated, electrically conductive tip that is ideal for various electrical characterization applications.
-The Pt-Ir coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apex of the tip.
- The coating on the back side of the cantilever enhances laser reflectivity.
- Unmounted for all AFMs.

Add To Cart

Model Instrument Mount Pack Size Price Pack Quantity
CONTV-PT All Unmounted 10 $235.00 (USD)

Quantity discounts available

2-4$223.25 (USD)
5-37$204.45 (USD)
38+$159.80 (USD)

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 13 10 16 0.2 0.1 0.4 450 405 495 50 45 55

Tip Specification

Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5ºº
Back Angle (BA): 15 ± 2.5º º
Side Angle (SA): 22.5 ± 2.5º º
Tip Radius (Nom): 25 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5-25 µm

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2 µm
Cantilever Thickness (RNG): 1.5 - 2.5 µm
Front Side Coating: Conductive PtIr
Back Side Coating: Reflective PtIr
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