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TESPAW-V2

Product Description:

A wafer of High quality etched silicon probes for TappingMode™ and other non-contact modes.  Unmounted for use on standard AFM's.

Bruker AFM Probes has introduced an improved version of its popular,TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premiumetched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model TESPW-V2.  

The current model TESPAW is available for ordering through early 2014 at which point, it will become obsolete.

Add To Cart

Model Instrument Mount Pack Size Price Pack Quantity
TESPAW-V2 All Unmounted 375 $6,156.00 (USD)


Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 320 270 370 37 19 55 123 120 125 40 37 42

Tip Specification

Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5ºº
Back Angle (BA): 17.5 ± 2.5º º
Side Angle (SA): 20 ± 2.5º º
Tip Radius (Nom): 7 nm
Tip Radius (Max): 10 nm
Tip SetBack (TSB)(Nom): 13.5 µm
Tip Set Back (TSB)(RNG): 11.5 - 15 µm

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.3 µm
Cantilever Thickness (RNG): 2.8 - 3.8 µm
Back Side Coating: Reflective Aluminum
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