A wafer of High quality etched silicon probes for TappingMode™ and other non-contact modes. Unmounted for use on standard AFM's.
Bruker AFM Probes has introduced an improved version of its popular,TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premiumetched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.
The new design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model
TESPW-V2.
The current model
TESPAW is available for ordering through early 2014 at which point, it will become obsolete.