Home → Product
Easy Product Wizard
Search Products Clear selection


Product Description:

A pack of 10 High quality etched silicon probes for TappingMode™ and other non-contact modes.  Unmounted for use on standard AFM's. 

Bruker AFM Probes has introduced an improved version of its popular, TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model TESPA-V2.  

Add To Cart

Model Instrument Mount Pack Size Price Pack Quantity
TESP-V2 All Unmounted 10 $350.00 (USD)

Quantity discounts available

2-6$297.50 (USD)
7-15$262.50 (USD)
16-24$227.50 (USD)
25-37$192.50 (USD)
38+$157.50 (USD)

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 320 270 370 37 19 55 123 120 125 40 37 42

Tip Specification

Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5ºº
Back Angle (BA): 17.5 ± 2.5º º
Side Angle (SA): 20 ± 2.5º º
Tip Radius (Nom): 7 nm
Tip Radius (Max): 10 nm
Tip SetBack (TSB)(Nom): 13.5 µm
Tip Set Back (TSB)(RNG): 11.5 - 15 µm

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.3 µm
Cantilever Thickness (RNG): 2.8 - 3.8 µm
Optional Product Offerings
A pack of 10 High quality etched silicon probes fo...
Details | Shop
A wafer of High quality etched silicon probes for ...
Details | Shop
***Note: The TESP probe became obsolete in 2015, a...
Details | Shop
***Note: The TESPA probe became obsolete in 2015, ...
Details | Shop