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Product Description:

Super sharp non-contact mode probe with alignment grooves for Brukers NEOS and NEOS SENTERRA AFMs.
k = 48 N/m, f = 190 kHz
Nominal tip radius < 2nm

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Model Mount Pack Size Price Pack Quantity
PR-SSP10 Unmounted 10 $1,080.00 (USD)

Quantity discounts available

11+$939.60 (USD)

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 190 146 236 48 21 98 225 235 215 38 30 45

Tip Specification

Typical aspect ratio at 200 nm from tip apex in the order of 4:1.
Geometry: Super sharp
Tip Radius (Nom): 2 nm

Cantilever Specification

The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 7 µm
Cantilever Thickness (RNG): 6 - 8 µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 30 nm Al