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PR-EFM10

Product Description:

Electrostatic Force Microscopy (EFM) probes with alignment grooves for Brukers NEOS and NEOS SENTERRA AFMs.
k = 2.8 N/m, f = 75 kHz

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Model Mount Pack Size Price Pack Quantity
PR-EFM10 Unmounted 10 $520.00 (USD)

Quantity discounts available

QtyPrice/Pack
11+$452.40 (USD)



Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 75 45 115 2.8 0.5 9.5 225 235 215 28 20 35

Tip Specification

Geometry: Standard (Steep)
Tip Coating: Platinum/ Iridium

Cantilever Specification

25 nm thick double layer of chromium and platinum iridium5 on both sides of the cantilever. The tip side coating enhanes the conductivity of the tip and allows for electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the cantilever.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3 µm
Cantilever Thickness (RNG): 2 - 4 µm
Front Side Coating: Platinum/ Iridium
Back Side Coating: Reflective Platinum/ Iridium
Top Layer Front: 25 nm of PtIr5
Top Layer Back: 25 nm PtIr5