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Product Description:

Magnetic Force Microscopy (MFM) mode probes with alignment grooves for Brukers NEOS and NEOS SENTERRA AFMs.
k = 2.8 N/m, f = 75 kHz
Magnetic resolution < 50 nm

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Model Mount Pack Size Price Pack Quantity
PR-MFM10 Unmounted 10 $770.00 (USD)

Quantity discounts available

11+$669.90 (USD)

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 75 45 115 2.8 0.5 9.5 225 215 235 28 20 35

Tip Specification

Hard magnetic coating on the tip side, coercivity of approximately 300 Oe.
Geometry: Standard (Steep)

Cantilever Specification

The specific compositions and thicknesses of the MFM coatings are not provided because they are Veeco Proprietary. The materials and thicknesses listed are given as general guides.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3 µm
Cantilever Thickness (RNG): 2 - 4 µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 30 nm Al