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Product Description:

A pack of Silicon Probes.

Bruker's Value Line etched silicon probes for imaging in TappingMode and non-contact mode in air.  This probe is also available with Aluminum reflex coating as model NCHV-AW.

- 40N/m, 320kHz, No Reflective Coating.
- Unmounted for use on any AFM.

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Model Instrument Mount Pack Size Price Pack Quantity
NCHV-W All Unmounted 375 $5,000.00 (USD)

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 320 270 400 40 20 75 117 115 120 33 28 38

Tip Specification

Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5 º
Side Angle (SA): 22.5 ± 2.5 º
Tip Radius (Nom): 8 nm
Tip SetBack (TSB)(Nom): 12.5 µm
Tip Set Back (TSB)(RNG): 9 - 16 µm

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.5 µm
Cantilever Thickness (RNG): 2.8 - 4.2 µm
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