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Product Description:

42N/m, 320kHz, 10nm Tip Radius, 100nm-Wide-Spike @ 2µm, Al reflective coating

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Model Instrument Mount Pack Size Price Pack Quantity
FIB2-100A Vx & UVx Automated AFM Unmounted 5 $1,000.00 (USD)

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 320 230 410 42 20 80 125 110 140 40 30 50

Tip Specification

High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 20:1 at 2um from tip apex.
Geometry: High Aspect Ratio
Tip Height (h): 10 - 15µm
Front Angle (FA): 1 ± 0.5º
Back Angle (BA): 1 ± 0.5 º
Side Angle (SA): 1 ± 0.5 º
Tip Radius (Nom): 10 nm
Tip Radius (Max): 15 nm
Tip SetBack (TSB)(Nom): 15 µm
Tilt Compensation: 12º
Tip Set Back (TSB)(RNG): 5 - 25 µm
SpikeH(Rng): 4000 - 6000 nm
SpikeW: 100 nm

Cantilever Specification

Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 4 µm
Cantilever Thickness (RNG): 3.25 - 4.75 µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 45 ± 5nm of Al