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MPP-31120-10

Product Description:

***Note: Bruker has launched an improved RESPA-20 probe and recommends customers transition to this new probe model. The legacy model MPP-31120-10 is no longer available.

Cont20: 0.9N/m, 20kHz, Rotated Tip,Aluminum Reflective Coating

Bruker's flagship MPP probes are the preferred choice for high-sensitivity silicon probe imaging in contact mode in air.  Every aspect of the MPP design has been optimized to provide the most accurate profiling of microscopic features.  With precisely controlled cantilever geometry to enable repeatable scanning parameters, an extra sharp tip radius to reduce the AFM's minimum detectable feature size, and a taller tip to minimize squeeze film damping, the MPP is the industry standard for high-performance and high-quality imaging on a wide variety of sample types. 
Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 20 13 27 0.9 0.45 1.8 450 460 440 35 30 40

Tip Specification

This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.
Geometry: Rotated (Symmetric)
Tip Height (h): 15 - 20µm
Front Angle (FA): 15 ± 2º
Back Angle (BA): 25 ± 2 º
Side Angle (SA): 17.5 ± 2 º
Tip Radius (Nom): 8 nm
Tip Radius (Max): 12 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm

Cantilever Specification

Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating are recommended for thin cantilevers, highly reflective samples, and machine vision application.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.0 µm
Cantilever Thickness (RNG): 2.0 - 4.0 µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 40 ± 10 nm of Al
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