Home → Product
Easy Product Wizard
kHz
N/m
Search Products Clear selection

MPP-23120-10

Product Description:

***Note: Bruker has launched an improved RFESPA-190 probe and recommends customers transition to this new probe model. The legacy model MPP-23120-10 is no longer available.

Multi190: 35N/m, 190kHz, Rotated Tip, Aluminum Reflective Coating
Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 190 150 230 35 17.5 70 225 235 215 40 35 45

Tip Specification

This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.
Geometry: Rotated (Symmetric)
Tip Height (h): 15 - 20µm
Front Angle (FA): 15 ± 2º
Back Angle (BA): 25 ± 2 º
Side Angle (SA): 17.5 ± 2 º
Tip Radius (Nom): 8 nm
Tip Radius (Max): 12 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm

Cantilever Specification

Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating are recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 6.25 µm
Cantilever Thickness (RNG): 5.50 - 7.00 µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 40 ± 10 nm of Al
Optional Product Offerings
RFESP-190
A pack of 10 High quality etched silicon pro...
Details | Shop
RFESPW-190
A wafer of High quality etched silicon probe...
Details | Shop
RFESPA-190
A pack of 10 High quality etched silicon pro...
Details | Shop
RFESPAW-190
A wafer of High quality etched silicon probe...
Details | Shop