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Scanning Electrochemical Potential Microscopy (SECPM)
Scanning Electrochemical Potential Microscopy (SECPM) us a sharp needle as the afm probe. Detector signal is the electric potential difference between the AFM tip and sample (or between afm tip and a reference electrode) in an ionic or polar liquid, where an electric double-layer exists at the liquid/sample interface. SECPM charts the electric potential profile across the depth of the double-layer (versus Z, the tip-sample distance) at tip XY location. In feedback mode, the output signal adjusts the Z position of the scanner.
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Microwave Impedance Microscopy (sMIM) produces high quality images of local electrical properties with better than 50nm resolution. The technical approach is to utilize microwave reflections from a nm scale region of the sample directly under the MIM probe. The magnitude and phase of these reflections is dominated by the local electrical properties. The ScanWave sMIM measures these reflections as a function of position to create images of variations in dielectric constant and conductivity.
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