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Product Description:

***Note: The TESPA probe became obsolete in 2015, and replaced by the new model TESPA-V2.  Read the TESPA obsolescence notification letter here and contact your local Bruker representative if you have any questions or concerns.

Bruker's premier line of etched silicon probes are the industry standardfor imaging in TappingMode and non-contact mode in air.  Tightspecification control, unrivaled sensitivity, and dependably sharp tipsall contribute to producing consistently accurate, high-resolutionimages. 

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model TESP. 

For a probe with similar specifications at a lower cost try the NCHV-A probe, part of Bruker's new VALUE line!
Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 320 230 410 42 20 80 125 110 140 40 30 50

Tip Specification

Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5 º
Side Angle (SA): 22.5 ± 2.5 º
Tip Radius (Nom): 8 nm
Tip Radius (Max): 12 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm

Cantilever Specification

Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 4 µm
Cantilever Thickness (RNG): 3.25 - 4.75 µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 40 ± 10 nm of Al
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