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Electrochemistry
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General Topography
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Mode
Conductive AFM (CAFM)
Contact Mode
Critical Dimension (CD) AFM
Electrical Spectroscopy
Electrostatic Force Microscopy (EFM)
Fast Scan
Force Modulation
Force Spectroscopy
HarmoniX
Lateral Force Microscopy (LFM)
Magnetic Force Microscopy (MFM)
NanoIndentation
TappingMode/ Non-Contact
PeakForce QNM
PeakForce Tapping
PeakForce TUNA
Piezoresponse/ Piezoforce Microscopy (PFM)
ScanAsyst
Scanning Capacitance Mode (SCM)
Scanning Electrochemical Potential Microscopy (SECPM)
Scanning Spreading Resistance Mode (SSRM)
Nanoscale Thermal Analysis
Scanning Tunneling Microscopy (STM)
Surface Potential Microscopy (SPoM)
Torsional Resonance (TR)
Tunneling AFM (TUNA)
Deep Trench (DT)
Tip Enhanced Raman Spectroscopy (TERS)
Scanning Microwave Impedance Microscopy (sMIM)
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PeakForce QNM High-Accuracy
AFM
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Dimension Icon
Dimension FastScan
Dimension (Other)
EnviroScope
Innova
Insight
MultiMode
NEOS/ Senterra
Non-Bruker AFM
Vx and UVx
Resonant Frequency:
kHz
± 50kHz
± 100kHz
± 200kHz
Spring Constant:
N/m
± 0.05 N/m
± 0.1 N/m
± 5 N/m
± 10 N/m
± 15 N/m
and Greater
and Lower
Search Products
Clear selection
Featured Products
FASTSCAN-A
FastScan-A probes are designed specifically for imaging in air on the Dimension FastScan AFM. They
Details | Shop
MLCT-UC
Product Description:
A pack of Silicon Nitride Probes
Uncoated premium Contact Mode or Fluid TappingMode imaging and force measurement probes with a variety of extremely low spring constants for high force sensitivity and low drift. Unmounted for all AFMs.
Quantity=10
NOTES:
Currently out of stock. We recommend using
MLCT-BIO-DC
instead.
MLCT-BIO-DC
uniquely combines the advantages of uncoated probes (i.e. low drift) with those of coated probes (i.e. high reflectivity, therefore low interference).
Shape
Resonant Freq.
kHz
Spring Const.
N/m
Length
µm
Width
µm
Nom.
Min.
Max.
Nom.
Min.
Max.
Nom.
Min.
Max.
Nom.
Min.
Max.
A Triangular
22
15
30
0.07
0.025
0.14
175
180
170
22
17
27
B Rectangular
15
10
20
0.02
0.005
0.04
210
205
215
20
15
25
C Triangular
7
4
10
0.01
0.005
0.02
310
305
315
20
15
25
D Triangular
15
10
20
0.03
0.01
0.06
225
220
230
20
15
25
E Triangular
38
26
50
0.1
0.05
0.2
140
135
145
18
13
23
F Triangular
125
90
160
0.6
0.3
1.2
85
80
90
18
13
23
Tip Specification
Tip Schematic
Geometry:
Rotated (Symmetric)
Tip Height (h):
2.5 - 8.0
µm
Front Angle (FA):
15 ± 2.5
º
Back Angle (BA):
25 ± 2.5
º
Side Angle (SA):
17.5 ± 2.5
º
Tip Radius (Nom):
20
nm
Tip Radius (Max):
60
nm
Tip SetBack (TSB)(Nom):
4
µm
Tip Set Back (TSB)(RNG):
0 - 7
µm
Cantilever Specification
Cantilever Orientation diagram can be found here.
MLCT probes have less than 2deg of cantilever bend.
Cantilever schematic
Material:
Silicon Nitride
Geometry:
Rectangular & Triangular
Cantilevers Number:
6
Cantilever Thickness (Nom):
0.55
µm
Cantilever Thickness (RNG):
0.5 - 0.6
µm
Optional Product Offerings
MLCT
Bruker's Microlever AFM probes have soft Silicon N...
Details | Shop
MSCT-UC
Sharpened; 6 Cantilevers 0.01-0.50N/m; No Coatings...
Details | Shop
MLCT-UCMT-A
A pack of Silicon Nitride ProbesUncoated premium C...
Details | Shop
MLCT-UCMT-BF
A pack of Silicon Nitride ProbesUncoated premium C...
Details | Shop