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LTESP-MT

Product Description:

***Note: Thelegacy model LTESP-MT is no longer available.  Bruker has launched an improved LTESP-V2 probe and recommends that customers transition to this new probe model.  LTESP-V2 in combination with the Caliber mounts, model 1560-00, should be used instead.***

A pack of Silicon Probes
Premium Long-Lever TappingMode imaging probes.  Mounted for Explorer/Caliber AFMs.
Quantity=10

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 190 130 250 48 24 96 225 200 250 38 33 43

Tip Specification

LTESP probe, mounted for Bruker Caliber or Explorer AFMs
Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5 º
Side Angle (SA): 22.5 ± 2.5 º
Tip Radius (Nom): 8 nm
Tip Radius (Max): 12 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 7 µm
Cantilever Thickness (RNG): 6.5 - 7.5 µm
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TESP-MT
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