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TESP-SS

Product Description:

Super Sharp TESP Probe
- 42N/m, 320kHz
- 2-5nm Tip Radius of Curvature
- Super sharp spike tip. The small spike is silicon tip processed to <10deg half angles for the first 200nm of the tip apex.
- 10-Pack of Probes

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Model Instrument Mount Pack Size Price Pack Quantity
TESP-SS All Unmounted 10 $750.00 (USD)


Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 320 230 410 42 20 80 125 140 110 30 25 35

Tip Specification

Geometry: Super Sharp
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5 º
Side Angle (SA): 22.5 ± 2.5 º
Tip Radius (Nom): 2 nm
Tip Radius (Max): 5 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 4 µm
Cantilever Thickness (RNG): 3.5 - 4.5 µm
Optional Product Offerings
TESP-HAR
42N/m, 320kHz, High Aspect Ratio (5:1), No Reflect...
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TESP
***Note: The final day for ordering the TESP probe...
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TESP-SSW
Super Sharp: 42N/m, 320kHz, 2-5nm ROC, No Coating ...
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