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SCM-PIT

Product Description:

***Note: Bruker has launched an improved SCM-PIT-V2 probe and recommends customers transition to this new probe model.  Thelegacy SCM-PIT is no longer available.

Built on the high-performance FESP AFM probe, Bruker's SCM-PIT probe has a Platinum-Iridium coated, electrically conductive tip that is ideal for Electrical Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), and other electrical characterization applications.  The Pt-Ir coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apex of the tip.  The coating on the back side of the cantilever compensates for the stress created by the front side coating and also enhances laser reflectivity by a factor of up to 2.5 times.

AFM users with Bruker's latest electrical characterization techniques based upon PeakForce Tapping technology should consider using PFTUNA or PFQNE-AL probes.
Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 75 50 100 2.8 1 5 225 200 250 28 23 33

Tip Specification

Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5 º
Side Angle (SA): 22.5 ± 2.5 º
Tip Radius (Nom): 20 nm
Tip Radius (Max): 25 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm
Tip Coating: Platinum-Iridium

Cantilever Specification

Material: 0.01 - 0.025 Ocm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.75 µm
Cantilever Thickness (RNG): 2.0 - 3.5 µm
Front Side Coating: Conductive PtIr
Back Side Coating: Reflective PtIr
Optional Product Offerings
SCM-PIT-V2
Bruker's new SCM-PIT-V2 probe replaces the legacy ...
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SCM-PIC-V2
***Note: Bruker's new SCM-PIC-V2 probe replaces th...
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PFQNE-AL
Bruker's new PeakForce KPFM probes, 10-pack. ...
Details | Shop
SCM-PTSI
Bruker SCM-PtSi Probes For the highest resoluti...
Details | Shop