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SCM-PIC

Product Description:

***Note: Bruker has launched an improved SCM-PIC-V2 probe and recommends customers transition to this new probe model.  The legacy SCM-PIC is still available while supplies last, at which point it will become obsolete.

Built on the high-performance ESP AFM probe, Bruker's SCM-PIC probe has a Platinum-Iridium coated,electrically conductive tip that is ideal for Electrical Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), and other electrical characterization applications.  The Pt-Ir coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apex of the tip.  The coating on the back side of the cantilever compensates for the stress created by the front side coating and also enhances laser reflectivity by a factor of up to 2.5 times.

AFM users with Bruker's latest electrical characterization techniques based upon PeakForce Tapping technology should consider using PFTUNA or PFQNE-AL probes.

Add To Cart

Model Mount Pack Size Price Pack Quantity
SCM-PIC Unmounted 10 $450.00 (USD)

Quantity discounts available

QtyPrice/Pack
2-6$382.50 (USD)
7-15$337.50 (USD)
16-24$292.50 (USD)
25-37$247.50 (USD)
38+$202.50 (USD)



Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 13 10 16 0.2 0.1 0.4 450 405 495 50 45 55

Tip Specification

Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5 º
Side Angle (SA): 22.5 ± 2.5 º
Tip Radius (Nom): 20 nm
Tip Radius (Max): 25 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm
Tip Coating: Platinum-Iridium

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2 µm
Cantilever Thickness (RNG): 1.5 - 2.5 µm
Front Side Coating: Conductive PtIr
Back Side Coating: Reflective PtIr
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