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MPP-11100-10

Product Description:

***Note: Bruker has launched an improved RTESP-300 probe and recommends customers transition to this new probe model. The legacy model MPP-11100-10 (ie RTESP) is no longer available.

Bruker's flagship MPP probes are the preferred choice for high-sensitivity silicon probe imaging in TappingMode or non-contact mode in air.  Every aspect of the MPP design has been optimized to provide the most accurate profiling of microscopic features.  With precisely controlled cantilever geometry to enable repeatable scanning parameters, an extra sharp tip radius to reduce the AFM's minimum detectable feature size, and a taller tip to minimize squeeze film damping, the MPP is the industry standard for high-performance and high-quality imaging on a wide variety of sample types. 

Also known as the RTESP or Tap300, the MPP-11100-10 uses a rotated AFM tip to provide a more symmetric representation of sample features over 200 nm.  This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model MPP-11120-10.  

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 300 200 400 40 20 80 125 115 135 35 30 40

Tip Specification

This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.
Geometry: Rotated (Symmetric)
Tip Height (h): 15 - 20µm
Front Angle (FA): 15 ± 2º
Back Angle (BA): 25 ± 2 º
Side Angle (SA): 17.5 ± 2 º
Tip Radius (Nom): 8 nm
Tip Radius (Max): 12 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm

Cantilever Specification

No Coating
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.75 µm
Cantilever Thickness (RNG): 3.0 - 4.5 µm
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