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Product Description:

Hand-crafted natural diamond Nanoindenting tip. 
- Mounted for the Innova AFM.
- Quantity=1
- Specific spring constant range can be requested as a special order for added cost.  Contact your local Bruker representative for more information.

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Model Instrument Mount Pack Size Price Pack Quantity
NICT-MTAP Innova/CP-II Mounted 1 $2,225.00 (USD)

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 50 35 65 225 150 300 350 300 500 100 80 120

Tip Specification

The NICT-MTAP is an Innova mounted, hand crafted high force cantilever for nanoindenting/nanoscratching applications. The tip is designed to be ultra high strength and is fabricated by precision grinding of a solid diamond. These tips are not for use in general imaging. The diamond tip apex is the corner of a cube so that three right angle planes form the apex “A”. To provide more symmetric dents, the diamond is mounted with the vertical axis of the tip approximately normal to the sample when mounted on the microscope. The nanoindenting probe is designed for use in air and is not recommended for liquid operation due to contamination & solvent incompatibility issues.
Geometry: Rotated (Symmetric)
Tip Height (h): 50µm
Front Angle (FA): 55 ± 2º
Back Angle (BA): 35 ± 2 º
Side Angle (SA): 51 ± 2 º
Tip Radius (Nom): 40 nm
Tip Radius (Max): 50 nm
Tip SetBack (TSB)(Nom): 13 µm
Tip Set Back (TSB)(RNG): 5 - 20 µm

Cantilever Specification

Each cantilever individually qualified and is supplied with a calibration certificate. These probes can be repaired - contact Veeco Probes.
Material: Stainless Steel
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 13 µm
Cantilever Thickness (RNG): 11 - 15 µm