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Product Description:

***Note: Bruker has launched an improved RESPA-20 probe and recommends customers transition to this new probe model. The legacy model MPP-31123-10 (ie CONT20A-CP) is no longer available.  Please use the RESPA-20 in combination with the unmounted chip carrier model 00-107-0091.

Cont20: 0.9N/m, 20kHz, Rotated Tip, Al reflective coating.
Designed specifically for mounting on the Innova AFM system.
Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 20 13 27 0.9 0.45 1.8 450 460 440 35 30 40

Tip Specification

This probe uses a rotated tip to provide a more symmetric representation of features over 200nm. Mounted for Innova/CP-II SPMs.
Geometry: Rotated (Symmetric)
Tip Height (h): 15 - 20µm
Front Angle (FA): 15 ± 2º
Back Angle (BA): 25 ± 2 º
Side Angle (SA): 17.5 ± 2 º
Tip Radius (Nom): 8 nm
Tip Radius (Max): 12 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm

Cantilever Specification

The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.0 µm
Cantilever Thickness (RNG): 2.0 - 4.0 µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 40 ± 10 nm of Al
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