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MPP-22100-10

Product Description:

***Note: Bruker has launched an improved RFESP-40 probe and recommends customers transition to this new probe model. The legacy model MPP-22100-10 is no longer available.

Multi40: 0.9N/m, 40kHz, Rotated tip, No Coatings
Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 40 20 60 0.9 0.45 1.8 225 215 235 30 25 35

Tip Specification

This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.
Geometry: Rotated (Symmetric)
Tip Height (h): 15 - 20µm
Front Angle (FA): 15 ± 2º
Back Angle (BA): 25 ± 2 º
Side Angle (SA): 17.5 ± 2 º
Tip Radius (Nom): 8 nm
Tip Radius (Max): 12 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 1.5 µm
Cantilever Thickness (RNG): 1.0 - 2.25 µm
Optional Product Offerings
RFESP-40
A pack of 10 High quality etched silicon pro...
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RFESPW-40
A wafer of High quality etched silicon probe...
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RFESPA-40
A pack of 10 High quality etched silicon pro...
Details | Shop
RFESPAW-40
A wafer of High quality etched silicon probe...
Details | Shop