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Product Description:

***Note: Bruker has launched an improved RFESPA-75 probe and recommends customers transition to this new probe model. The legacy model MPP-21123-10 (ie MULTI75A-CP) is no longer available.  Please use the RFESPA-75 in combination with the unmounted chip carrier model 00-107-0091.

Multi75: 3N/m, 75kHz, Rotated Tip, Al reflective coating.

Designed specifically for mounting on the Innova AFM system.

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 75 50 100 3 1.5 6 225 235 215 35 30 40

Tip Specification

This probe uses a rotated tip to provide a more symmetric representation of features over 200nm. Mounted for Innova/CP-II SPMs.
Geometry: Rotated (Symmetric)
Tip Height (h): 15 - 20µm
Front Angle (FA): 15 ± 2º
Back Angle (BA): 25 ± 2 º
Side Angle (SA): 17.5 ± 2 º
Tip Radius (Nom): 8 nm
Tip Radius (Max): 12 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm

Cantilever Specification

The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applicaitons.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.0 µm
Cantilever Thickness (RNG): 2.5 - 3.5 µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 40 ± 10 nm of Al
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