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MPP-11123-10

Product Description:

***Note: Bruker has launched an improved RTESPA-300 probe and recommends customers transition to this new probe model. The legacy model MPP-11123-10 (ie RTESPA-CP) is no longer available.  Please use the RTESPA-300 in combination with the unmounted chip carrier model 00-107-0091.

A pack of Silicon Probes
Also known as "RTESPA-CP" or "Tap300A-CP"
Premium High-Resolution TappingMode silicon probes.  This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.

Designed specifically for mounting on the Innova AFM system.

Quantity=10
Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 300 200 400 40 20 80 125 135 115 35 30 40

Tip Specification

This probe uses a rotated tip to provide a more symmetric representation of features over 200nm. Mounted for Innova/CP-II SPMs. Also known as RTESPA-CP.
Geometry: Rotated (Symmetric)
Tip Height (h): 15 - 20µm
Front Angle (FA): 15 ± 2º
Back Angle (BA): 25 ± 2 º
Side Angle (SA): 17.5 ± 2 º
Tip Radius (Nom): 8 nm
Tip Radius (Max): 12 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm

Cantilever Specification

The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applicaiton.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.75 µm
Cantilever Thickness (RNG): 3.0 - 4.5 µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 40 ± 10 nm of Al