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Product Description:


A wafer of Magnetic Probes
Low coercivity MFM Probes with a conductive coating that can often be an excellent and cost-effective solution for electrical and capacitance microscopy.  Unmounted for all AFMs.
*Due to the inherent danger of mishandling or contamination during extraction of probes by non-Veeco personnel, we do not guarantee performance of wafers once opened at the consumers site.  Instead, we highly recommend buying in larger quantities of 10-packs to guarantee performance, taking advantage of bulk discount pricing.
Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 75 50 100 2.8 1 5 225 200 250 28 23 33

Tip Specification

Coercivity: < 10 Oe. (Low) Moment: < 1e-13 EMU (Medium/Low) Use this probe as an alternative for imaging magnetic samples with very strong stray fields (e.g. NdFeB permanent magnets), and to highlight grain boundaries. For a sample pack of -HM, -LM, and -LC see part MESPSP.
Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5 º
Side Angle (SA): 22.5 ± 2.5 º
Tip Radius (Nom): 35 nm
Tip Radius (Max): 50 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm
Tip Coating: Magnetic

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.75 µm
Cantilever Thickness (RNG): 2.0 - 3.5 µm
Front Side Coating: Magnetic Fe
Back Side Coating: Reflective Fe
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