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Product Description:

A pack of Magnetic Probes
Standard Moment MFM Probes with a conductive coating that can often be an excellent and cost-effective solution for electrical and capacitance microscopy.  Mounted for CPII / Innova AFMs.

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Model Instrument Mount Pack Size Price Pack Quantity
MESP-CPMT Innova/CP-II Mounted 10 $700.00 (USD)

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 75 50 100 2.8 1 5 225 200 250 28 23 33

Tip Specification

Coercivity: ~400 Oe. (Medium) Moment: 1e-13 EMU (Medium) The MESP is the standard probe for MFM. Since the magnetic coating is also conductive, the MESP is often an excellent cost effective choice for electrical and capacitance microscopy.
Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5 º
Side Angle (SA): 22.5 ± 2.5 º
Tip Radius (Nom): 20 nm
Tip Radius (Max): 50 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm
Tip Coating: Magnetic

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.75 µm
Cantilever Thickness (RNG): 2.0 - 3.5 µm
Front Side Coating: Magnetic CoCr
Back Side Coating: Reflective CoCr
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