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LTESP

Product Description:

***Note: Bruker has launched an improved LTESP-V2 probe and recommends customers transition to this new probe model. The current model LTESP is available for ordering through early 2015 at which point, it will become obsolete.

A pack of Silicon Probes
Premium Long-Lever TappingMode imaging probes.  Unmounted for all AFMs.
Quantity=10
Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 190 130 250 48 24 96 225 250 200 38 33 43

Tip Specification

Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5 º
Side Angle (SA): 22.5 ± 2.5 º
Tip Radius (Nom): 8 nm
Tip Radius (Max): 12 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 7 µm
Cantilever Thickness (RNG): 6.5 - 7.5 µm
Optional Product Offerings
LTESP-V2
A pack of 10 High quality long-lever etched silico...
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LTESPW-V2
A wafer of High quality long-lever etched silicon ...
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LTESPA-V2
A pack of 10 High quality long-lever etched silico...
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LTESPAW-V2
*20% Wafer discount in effect* A wafer of...
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