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HAR1-200-10

Product Description:

A pack of High Aspect Ratio Probes
Tilt-Compensated High Aspect Ratio (5:1) Focused Ion Beam (FIB) probes for high resolution TappingMode imaging on samples with tall/deep geometries.  Unmounted for all AFMs.
Quantity=10

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Model Mount Pack Size Price Pack Quantity
HAR1-200-10 Unmounted 10 $1,000.00 (USD)

Quantity discounts available

QtyPrice/Pack
2-6$900.00 (USD)
7-15$850.00 (USD)
16-24$800.00 (USD)
25-37$750.00 (USD)
38+$600.00 (USD)



Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 320 230 410 42 10 80 125 110 140 40 30 50

Tip Specification

High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 5:1 at 1um from tip apex.
Geometry: High Aspect Ratio
Tip Height (h): 10 - 15µm
Front Angle (FA): 5 ± 0.5º
Back Angle (BA): 5 ± 0.5 º
Side Angle (SA): 5 ± 0.5 º
Tip Radius (Nom): 10 nm
Tip Radius (Max): 15 nm
Tip SetBack (TSB)(Nom): 15 µm
Tilt Compensation: 12º
Tip Set Back (TSB)(RNG): 5 - 25 µm
SpikeH(Rng): 1000 - 2000 nm
SpikeW: 200 nm

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 4 µm
Cantilever Thickness (RNG): 3.5 - 4.5 µm
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